发明名称 |
Substrate processing apparatus and method for detecting an abnormality of an ozone gas concentration |
摘要 |
A substrate processing apparatus is provided that includes an ozonizer for generating ozone gas and an ozone sensor for detecting an ozone gas concentration. The substrate processing apparatus processes a substrate by using the ozone gas supplied from the ozonizer. The substrate processing apparatus includes a monitor unit for monitoring the ozone gas concentration detected by the ozone sensor and a control unit for detecting an abnormality of the ozone gas concentration based on the monitored ozone gas concentration and the monitored discharge power. |
申请公布号 |
US9618493(B2) |
申请公布日期 |
2017.04.11 |
申请号 |
US201414565747 |
申请日期 |
2014.12.10 |
申请人 |
Tokyo Electron Limited |
发明人 |
Kondo Masaki |
分类号 |
G01N33/00 |
主分类号 |
G01N33/00 |
代理机构 |
IPUSA, PLLC |
代理人 |
IPUSA, PLLC |
主权项 |
1. A substrate processing apparatus for processing a substrate by using ozone gas comprising:
an ozonizer for generating ozone gas by using electrodes; an ozone sensor configured to detect an ozone gas concentration of the ozone gas generated by the ozonizer; a monitoring unit configured to monitor the ozone gas concentration detected by the ozone sensor and a discharge power that is electrical power output from the electrodes of the ozonizer; and a control unit configured to detect an abnormality of the ozone gas concentration based on the monitored ozone gas concentration and the monitored discharge power. |
地址 |
Tokyo JP |