发明名称 Substrate processing apparatus and method for detecting an abnormality of an ozone gas concentration
摘要 A substrate processing apparatus is provided that includes an ozonizer for generating ozone gas and an ozone sensor for detecting an ozone gas concentration. The substrate processing apparatus processes a substrate by using the ozone gas supplied from the ozonizer. The substrate processing apparatus includes a monitor unit for monitoring the ozone gas concentration detected by the ozone sensor and a control unit for detecting an abnormality of the ozone gas concentration based on the monitored ozone gas concentration and the monitored discharge power.
申请公布号 US9618493(B2) 申请公布日期 2017.04.11
申请号 US201414565747 申请日期 2014.12.10
申请人 Tokyo Electron Limited 发明人 Kondo Masaki
分类号 G01N33/00 主分类号 G01N33/00
代理机构 IPUSA, PLLC 代理人 IPUSA, PLLC
主权项 1. A substrate processing apparatus for processing a substrate by using ozone gas comprising: an ozonizer for generating ozone gas by using electrodes; an ozone sensor configured to detect an ozone gas concentration of the ozone gas generated by the ozonizer; a monitoring unit configured to monitor the ozone gas concentration detected by the ozone sensor and a discharge power that is electrical power output from the electrodes of the ozonizer; and a control unit configured to detect an abnormality of the ozone gas concentration based on the monitored ozone gas concentration and the monitored discharge power.
地址 Tokyo JP