| 发明名称 | Infrared imaging system | ||
| 摘要 | An infrared imaging system used for infrared rays of wavelength of 5 micrometers or greater, the system including, from the object side to the image side, an aperture, a lens made of synthetic resin and an imaging element, the object side surface of the lens being convex to the object side in the paraxial area, wherein F-number of the system is 1.4 or smaller. | ||
| 申请公布号 | US9618660(B2) | 申请公布日期 | 2017.04.11 |
| 申请号 | US201514621588 | 申请日期 | 2015.02.13 |
| 申请人 | NALUX CO., LTD.;FLIR Systems, Inc. | 发明人 | Fujimura Kayoko;Ikeda Katsumoto;Seki Daisuke |
| 分类号 | G02B3/04;G02B13/14;G02B3/08 | 主分类号 | G02B3/04 |
| 代理机构 | Haynes and Boone, LLP | 代理人 | Haynes and Boone, LLP |
| 主权项 | 1. An infrared imaging system comprising: an aperture configured to receive infrared radiation having wavelengths of 5 micrometers or greater from an object; an imaging element; a single synthetic resin lens disposed between the aperture and the imaging element and configured to pass the infrared radiation to the imaging element, wherein the synthetic resin lens comprises an object side surface and an image side surface, wherein the object side surface comprises a convex entry surface in a paraxial area; wherein the imaging element is configured to receive the infrared radiation from the image side surface of the synthetic resin lens without another lens disposed between the aperture and the imaging element; and wherein the system exhibits an F-number of 1.4 or smaller. | ||
| 地址 | JP | ||