发明名称 METHODS OF FORMING METAL SILICIDES
摘要 A method of forming a metal silicide can include depositing an interface layer on exposed silicon regions of a substrate, where the interface layer includes a silicide forming metal and a non-silicide forming element. The method can include depositing a metal oxide layer over the interface layer, where the metal oxide layer includes a second silicide forming metal. The substrate can be subsequently heated to form the metal silicide beneath the interface layer, using silicon from the exposed silicon regions, the first silicide forming metal of the interface layer and the second silicide forming metal of the metal oxide layer.
申请公布号 US2017098545(A1) 申请公布日期 2017.04.06
申请号 US201514873494 申请日期 2015.10.02
申请人 ASM IP Holding B.V. 发明人 Woodruff Jacob Huffman
分类号 H01L21/285;H01L21/768 主分类号 H01L21/285
代理机构 代理人
主权项 1. A method of forming a metal silicide, comprising: depositing an interface layer on exposed silicon regions of a substrate, the interface layer comprising a first silicide forming metal and a non-silicide forming element; depositing a metal oxide layer over the interface layer, wherein the metal oxide layer comprises a second silicide forming metal; and heating the substrate to form the metal silicide beneath the interface layer, the metal silicide comprising silicon from the formerly exposed silicon regions, first silicide forming metal from the interface layer, and second silicide forming metal from the metal oxide layer, wherein depositing the interface layer comprises a plurality of cycles of a vapor deposition process, each cycle of the plurality of cycles comprising alternately and sequentially contacting the surface of the substrate with a first vapor phase precursor comprising the first silicide forming metal and a second vapor phase precursor comprising the non-silicide forming element, wherein the first vapor phase precursor reacts with the second vapor phase precursor.
地址 Almere NL
您可能感兴趣的专利