发明名称 |
DATA STORAGE |
摘要 |
A data storage device comprises an array of data storage elements arranged as multiple partitions each comprising two or more data storage elements, each data storage element being associated with a respective identifier which identifies a data item currently stored by that data storage element; a predictor configured to compare, for each partition, information derived from the identifiers associated with the data storage elements of that partition with information derived from an identifier associated with the required data item, to identify a subset of partitions that do not store the required data item; and a comparator configured to compare identifiers associated with data storage elements of one or more partitions with the identifier associated with the required data item, wherein any partitions in the subset of partitions are excluded from the test group of partitions. |
申请公布号 |
US2017090791(A1) |
申请公布日期 |
2017.03.30 |
申请号 |
US201615256942 |
申请日期 |
2016.09.06 |
申请人 |
ARM LIMITED |
发明人 |
GRUBISIC Roko;PERSSON Häkan Lars-Göran;KOUVELI Georgia |
分类号 |
G06F3/06;G06F12/1018 |
主分类号 |
G06F3/06 |
代理机构 |
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代理人 |
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主权项 |
1. A data storage device comprising:
an array of data storage elements arranged as multiple partitions each comprising two or more data storage elements, each data storage element being associated with a respective identifier which identifies a data item currently stored by that data storage element; a predictor configured to compare, for each partition, information derived from the identifiers associated with the data storage elements of that partition with information derived from an identifier associated with the required data item, to identify a subset of partitions that do not store the required data item; and a comparator configured to compare identifiers associated with data storage elements of one or more partitions in a test group of partitions with the identifier associated with the required data item, wherein any partitions in the subset of partitions are excluded from the test group of partitions. |
地址 |
Cambridge GB |