| 主权项 |
1. A microscope, comprising:
a holder configured to hold a sample carrier; an imaging unit, comprising a first detector and a first imaging optical system, the first imaging optical system configured to image at least one part of a sample held by the sample carrier along a first optical axis onto the first detector; a control unit; and a detection unit, comprising an illuminating module, a second detector and a second imaging optical system, wherein the illuminating module is configured to illuminate a sample carrier which is held by the holder with a predetermined pattern which is imaged by the second imaging optical system onto the second detector, wherein the second detector is masked such that a detection area of the second detector which the pattern occupies during focused imaging, or a part of the detection area, is defined as an analysis area, and wherein the control unit is configured to only analyze the measured values originating from the analysis area by the second detector in order to determine the direction of the change of position of the focus of the first imaging optical system along the first optical axis with the aim of positioning the boundary surface of the sample carrier directed towards the sample side in the depth of field area of the first imaging optical system. |
