CAPACITANCE MEASUREMENT

摘要

Embodiments of the present invention may provide a method of measuring an unknown capacitance of a device. The method may comprise the steps of driving a test signal to a circuit system that includes a current divider formed by the device with unknown capacitance and a reference capacitor; mirroring a current developed in the reference capacitor to a second circuit system that includes a measurement impedance; measuring a voltage within the second circuit system; and deriving a capacitance of the unknown capacitance based on the measured voltage with reference to a capacitance of the reference capacitor and the measurement impedance.

主权项

1. A method for measuring a capacitance of a capacitive device, comprising:
applying a first current to a first circuit system comprising a current divider formed by the capacitive device and a reference capacitor; mirroring a second current developed in the reference capacitor to a second circuit system that includes a measurement capacitance; measuring a voltage generated across the measurement capacitance; and deriving the capacitance of the capacitive device based on the measured voltage and capacitance value of the reference capacitor and an impedance value of the measurement capacitance.