发明名称 SIMULATION-SUPPORTED DEFECT EVALUATION USING ULTRASOUND
摘要 An ultrasound device for examining a component may include a measuring device for performing an ultrasonic measurement of the component and an analysis device. The ultrasound device may be designed to quantify structural elements, such as defects, in the component. For this purpose, the analysis device may be designed to determine a number and a respective position of at least one internal structural element of the component as a function of the ultrasonic measurement data from the measuring device using a reconstruction method, and to use a simulator to determine at least one character of each structural element by simulating the ultrasound measurement and adapting each model as a function of each ascertained position using a respective model for the at least one structural element.
申请公布号 EP3146325(A1) 申请公布日期 2017.03.29
申请号 EP20150719190 申请日期 2015.04.23
申请人 Siemens Aktiengesellschaft 发明人 FENDT, Karl;MOOSHOFER, Hubert;RUPITSCH, Stefan Johann
分类号 G01N29/06;G01N29/11;G01N29/26;G01N29/44;G01S15/89 主分类号 G01N29/06
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