发明名称 N-type thin film transistor
摘要 An N-type thin film transistor includes an insulating substrate, a semiconductor carbon nanotube layer, an MgO layer, a functional dielectric layer, a source electrode, a drain electrode, and a gate electrode. The semiconductor carbon nanotube layer is located on the insulating substrate. The source electrode and the drain electrode electrically connect the semiconductor carbon nanotube layer, wherein the source electrode and the drain electrode are spaced from each other, and a channel is defined in the semiconductor carbon nanotube layer between the source electrode and the drain electrode. The MgO layer is located on the semiconductor carbon nanotube layer. The functional dielectric layer covers the MgO layer. The gate electrode is located on the functional dielectric layer.
申请公布号 US9608218(B2) 申请公布日期 2017.03.28
申请号 US201514985252 申请日期 2015.12.30
申请人 Tsinghua University;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 Li Guan-Hong;Li Qun-Qing;Jin Yuan-Hao;Fan Shou-Shan
分类号 H01L51/05;H01L51/00 主分类号 H01L51/05
代理机构 代理人 Ma Zhigang
主权项 1. An N-type thin film transistor, comprising: an insulating substrate; a semiconductor carbon nanotube layer located on the insulating substrate; a source electrode and a drain electrode electrically connected to the semiconductor carbon nanotube layer; wherein the source electrode and the drain electrode are spaced from each other, and a channel is defined in the semiconductor carbon nanotube layer between the source electrode and the drain electrode; an MgO layer on the semiconductor carbon nanotube layer; a functional dielectric layer covering the MgO layer; and a gate electrode on the functional dielectric layer.
地址 Beijing CN