发明名称 MEMS SENSOR WITH SIDE PORT AND METHOD OF FABRICATING SAME
摘要 A MEMS sensor package comprises a MEMS die that includes a substrate having a sensor formed thereon and a cap layer coupled to the substrate. The cap layer has a cavity overlying a substrate region at which the sensor resides. A port extends between the cavity and a side wall of the MEMS die and enables admittance of fluid into the cavity. Fabrication methodology entails providing a substrate structure having sensors formed thereon, providing a cap layer structure having inwardly extending cavities, and forming a channel between pairs of the cavities. The cap layer structure is coupled with the substrate structure and each channel is interposed between a pair of cavities. A singulation process produces a pair of sensor packages, each having a port formed by splitting the channel, where the port is exposed during singulation and extends between its respective cavity and side wall of the sensor package.
申请公布号 US2017081179(A1) 申请公布日期 2017.03.23
申请号 US201514861550 申请日期 2015.09.22
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 DAWSON CHAD S.;HOOPER STEPHEN R.;LI FENGYUAN;SALIAN ARVIND S.
分类号 B81B7/00;B81C1/00 主分类号 B81B7/00
代理机构 代理人
主权项 1. A microelectromechanical systems (MEMS) sensor package comprising: a MEMS die, said MEMS die comprising: a substrate having a first inner surface and a first outer surface;a MEMS sensor formed on said first inner surface; anda cap layer having a second inner surface and a second outer surface, wherein said second inner surface of said cap layer is coupled to said first inner surface of said substrate, said cap layer includes a cavity extending inwardly from said second inner surface and overlying a region of said first inner surface of said substrate, said MEMS sensor resides in said cavity at said region of said first inner surface of said substrate, and a port extends between said cavity and a side wall of said MEMS die, said side wall extending between said first outer surface of said substrate and said second outer surface of said cap layer; and an encapsulant covering said MEMS die, wherein said encapsulant is absent from said side wall and said encapsulant does not obstruct said port.
地址 AUSTIN TX US