发明名称 |
PROBE PIN AND INSPECTION TOOL INCLUDING SAME |
摘要 |
This probe pin comprises a coil spring (50), a first plunger (30), and a second plunger (40). The first plunger (30) includes: a first insertion part (31) positioned inside the coil spring (50); and a first contact part (32) that is exposed outside the coil spring, and that is provided with a first contact point (34) capable of moving back and forth along a center line. The second plunger (40) includes: a second insertion part (41) that is positioned inside the coil spring (50) and that is slidably connected to the first insertion part (31); and a second contact part (42) that is exposed outside the coil spring, and that is provided with a second contact point (47) capable of moving back and forth in a direction intersecting with the center line. |
申请公布号 |
WO2017047495(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
WO2016JP76460 |
申请日期 |
2016.09.08 |
申请人 |
OMRON CORPORATION |
发明人 |
TERANISHI, Hirotada;SAKAI, Takahiro;KONDO, Makoto |
分类号 |
G01R1/067;H01R12/72;H01R13/24 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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