发明名称 半導体装置
摘要 Aspects of the invention can include a semiconductor device that includes an output stage IGBT and a Zener diode on the same semiconductor substrate. The IGBT can include a first p well layer, an n emitter region on the surface region of the first p well layer, a gate electrode deposited on a gate insulating film, and an emitter electrode on the emitter region. The Zener diode can include a p+ layer formed in the surface region of a second p well layer in the place different from the first p well layer and has a higher concentration than the second p well layer, an anode electrode in ohmic contact with the surface of the p+ layer, an n− layer having a lower concentration than the second p well layer, and a cathode electrode in Schottky contact with the surface of the n− layer.
申请公布号 JP6098041(B2) 申请公布日期 2017.03.22
申请号 JP20120083931 申请日期 2012.04.02
申请人 富士電機株式会社 发明人 中村 浩;宮沢 繁美
分类号 H01L27/04;H01L21/329;H01L21/822;H01L21/8234;H01L27/06;H01L27/088;H01L29/739;H01L29/78;H01L29/861;H01L29/866;H01L29/868 主分类号 H01L27/04
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