发明名称 Inspection device
摘要 An inspection device is provided including a light emitting element configured to emit light, a light receiving element arranged so as to face the light emitting element and configured to receive the light, where one of the light emitting element and the light receiving element is used as a to-be-inspected element, and the other one of the light emitting element and the light receiving element is used as an inspection element that inspects the to-be-inspected element, a housing configured to accommodate the inspection element, and a lid configured to be detachable from the housing. In the inspection device, one of the housing and the lid is provided with an arrangement unit to which the to-be-inspected element is set in a detachable manner, and the lid includes a contact unit that electrically contacts the to-be-inspected element by touching and detaching from the to-be-inspected element.
申请公布号 US9599659(B2) 申请公布日期 2017.03.21
申请号 US201514722746 申请日期 2015.05.27
申请人 Ricoh Company, Ltd. 发明人 Tsuda Keiji
分类号 G01N21/00;G01R31/26;G01J1/02;G01J1/42 主分类号 G01N21/00
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. An inspection device, comprising: a light emitter that emits light; a light sensor that faces the light emitter and receives the light, wherein one of the light emitter and the light sensor is a to-be-inspected element, and the other one of the light emitter and the light sensor is an inspection element that inspects the to-be-inspected element; a housing including a tubular body that accommodates the inspection element in a detachable manner; and a lid that is detachable from the housing, wherein the lid includes an electrical contact that electrically contacts the to-be-inspected element by touching and detaching from the to-be-inspected element.
地址 Tokyo JP
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