发明名称 |
HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD |
摘要 |
The present invention includes: an image capturer capturing an image of the sample to be measured; an image acquirer acquiring image data of the sample captured by the image capturer; a pattern searcher performing, on the image data of the sample acquired by the image acquirer, pattern searching process using a pattern image selected based on the sample and identifying a position in the image matching the pattern image; a profile extractor extracting a profile of the sample based on the position in the image identified by the pattern searcher; a calculator calculating a hardness measurement position of the sample based on the profile extracted by the profile extractor; and a measurer executing hardness testing on the sample based on the hardness measurement position calculated by the calculator and measuring the hardness of the sample. |
申请公布号 |
US2017074764(A1) |
申请公布日期 |
2017.03.16 |
申请号 |
US201615255753 |
申请日期 |
2016.09.02 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
FURUTA Eiji;KAIEDA Makoto;TAKADA Akira |
分类号 |
G01N3/42;G06T7/00 |
主分类号 |
G01N3/42 |
代理机构 |
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代理人 |
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主权项 |
1. A hardness tester measuring hardness of a sample by loading a predetermined test force on the sample with an indenter to form an indentation in a surface of the sample, then measuring dimensions of the indentation, the hardness tester comprising:
a camera configured to capture an image of the sample to be measured; and a processor comprising:
an image acquirer configured to acquire image data of the sample captured by the camera;a pattern searcher configured to perform, on the image data of the sample acquired by the image acquirer, a pattern searching process using a pattern image selected based on the sample and identifying a position in the image matching the pattern image;a profile extractor configured to extract a profile of the sample based on the position in the image identified by the pattern searcher;a calculator configured to calculate a hardness measurement position of the sample based on the profile extracted by the profile extractor; anda measurer configured to execute hardness testing on the sample based on the hardness measurement position calculated by the calculator and measuring the hardness of the sample. |
地址 |
Kanagawa JP |