发明名称 DEVICES INCLUDING FIN TRANSISTORS ROBUST TO GATE SHORTS AND METHODS OF MAKING THE SAME
摘要 Disclosed are methods, systems and devices, including a method that includes the acts of etching an inter-row trench in a substrate, substantially or entirely filling the inter-row trench with a dielectric material, and forming a fin and a insulating projection at least in part by etching a gate trench in the substrate. In some embodiments, the insulating projection includes at least some of the dielectric material in the inter-row trench.
申请公布号 EP2243154(B1) 申请公布日期 2017.03.15
申请号 EP20090712651 申请日期 2009.01.29
申请人 Micron Technology, Inc. 发明人 JUENGLING, Werner
分类号 H01L29/66;H01L21/336;H01L21/8242;H01L27/088;H01L27/108;H01L29/423;H01L29/78 主分类号 H01L29/66
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