发明名称 Eliminate sawing-induced peeling through forming trenches
摘要 A package includes a device die, a molding material encircling the device die, wherein a top surface of the molding material is substantially level with a top surface of the device die, and a bottom dielectric layer over the device die and the molding material. A plurality of redistribution lines (RDLs) extends into the bottom dielectric layer and electrically coupling to the device die. A top polymer layer is over the bottom dielectric layer, with a trench ring penetrating through the top polymer layer. The trench ring is adjacent to edges of the package. The package further includes Under-Bump Metallurgies (UBMs) extending into the top polymer layer.
申请公布号 US9589903(B2) 申请公布日期 2017.03.07
申请号 US201514713935 申请日期 2015.05.15
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chen Jie;Chen Hsien-Wei
分类号 H01L23/544;H01L23/498;H01L23/00;H01L23/29;H01L23/31;H01L21/56 主分类号 H01L23/544
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A package comprising: a device die; a molding material encircling the device die, wherein a top surface of the molding material is substantially level with a top surface of the device die; a bottom dielectric layer over the device die and the molding material; a plurality of redistribution lines (RDLs) extending into the bottom dielectric layer and electrically coupling to the device die; a top polymer layer over the bottom dielectric layer; an intermediate polymer layer between the top polymer layer and the bottom dielectric layer, with a trench ring penetrating through the intermediate polymer layer, wherein the trench ring is adjacent to edges of the package, and the trench ring is filled by the top polymer layer; and Under-Bump Metallurgies (UBMs) extending into the top polymer layer.
地址 Hsin-Chu TW