发明名称 Magnetoresistive memory device and manufacturing method of the same
摘要 According to one embodiment, a manufacturing method of a magnetoresistive memory device includes forming a first magnetic layer on a substrate, forming a magnetoresistive effect element on the first magnetic layer, forming a mask on a part of the magnetoresistive effect element, selectively etching the magnetoresistive effect element using the mask, forming a sidewall insulating film on a sidewall of the magnetoresistive effect element exposed by the etching, selectively etching the first magnetic layer using the mask and the sidewall insulating film and forming a deposition layer containing a magnetic material on a sidewall of the first magnetic layer and the sidewall insulating film, and introducing ions into the deposition layer.
申请公布号 US9590174(B2) 申请公布日期 2017.03.07
申请号 US201514629120 申请日期 2015.02.23
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Toko Masaru;Sugiura Kuniaki;Hashimoto Yutaka;Nishiyama Katsuya;Kai Tadashi
分类号 H01L21/02;H01L21/00;H01L43/12;H01L43/08;H01L43/02;H01L27/22 主分类号 H01L21/02
代理机构 Holtz, Holtz & Volek PC 代理人 Holtz, Holtz & Volek PC
主权项 1. A magnetoresistive memory device, comprising: a first magnetic layer including a first metal provided on a substrate; a first nonmagnetic layer provided on the first magnetic layer; a layered structure including a second magnetic layer provided on the first nonmagnetic layer, a second nonmagnetic layer, and a third magnetic layer; a first sidewall insulating film covering a part of a sidewall of the layered structure; and a second sidewall insulating film provided on the first sidewall insulating film, wherein the second sidewall insulating film includes the first metal and is in contact with the first magnetic layer.
地址 Tokyo JP