发明名称 |
Magnetoresistive memory device and manufacturing method of the same |
摘要 |
According to one embodiment, a manufacturing method of a magnetoresistive memory device includes forming a first magnetic layer on a substrate, forming a magnetoresistive effect element on the first magnetic layer, forming a mask on a part of the magnetoresistive effect element, selectively etching the magnetoresistive effect element using the mask, forming a sidewall insulating film on a sidewall of the magnetoresistive effect element exposed by the etching, selectively etching the first magnetic layer using the mask and the sidewall insulating film and forming a deposition layer containing a magnetic material on a sidewall of the first magnetic layer and the sidewall insulating film, and introducing ions into the deposition layer. |
申请公布号 |
US9590174(B2) |
申请公布日期 |
2017.03.07 |
申请号 |
US201514629120 |
申请日期 |
2015.02.23 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Toko Masaru;Sugiura Kuniaki;Hashimoto Yutaka;Nishiyama Katsuya;Kai Tadashi |
分类号 |
H01L21/02;H01L21/00;H01L43/12;H01L43/08;H01L43/02;H01L27/22 |
主分类号 |
H01L21/02 |
代理机构 |
Holtz, Holtz & Volek PC |
代理人 |
Holtz, Holtz & Volek PC |
主权项 |
1. A magnetoresistive memory device, comprising:
a first magnetic layer including a first metal provided on a substrate; a first nonmagnetic layer provided on the first magnetic layer; a layered structure including a second magnetic layer provided on the first nonmagnetic layer, a second nonmagnetic layer, and a third magnetic layer; a first sidewall insulating film covering a part of a sidewall of the layered structure; and a second sidewall insulating film provided on the first sidewall insulating film, wherein the second sidewall insulating film includes the first metal and is in contact with the first magnetic layer. |
地址 |
Tokyo JP |