发明名称 Semiconductor device having nanowire channel
摘要 A semiconductor device is provided as follows. A fin-type pattern includes first and second oxide regions in an upper portion of the fin-type pattern. The fin-type pattern is extended in a first direction. A first nanowire is extended in the first direction and spaced apart from the fin-type pattern. A gate electrode surrounds a periphery of the first nanowire, extending in a second direction intersecting the first direction. The gate electrode is disposed on a region of the fin-type pattern. The region is positioned between the first and the second oxide regions. A first source/drain is disposed on the first oxide region and connected with an end portion of the first nanowire.
申请公布号 US9590038(B1) 申请公布日期 2017.03.07
申请号 US201514921006 申请日期 2015.10.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kim Dong-Kwon;Seo Kang-Ill
分类号 H01L29/06;H01L29/423;H01L29/51;H01L29/78 主分类号 H01L29/06
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A semiconductor device, comprising: a fin-type pattern protruded from a substrate, wherein the fin-type pattern is extended in a first direction, a first oxide region and a second oxide region on an upper portion of the fin-type pattern wherein the first oxide region and the second oxide region are spaced apart from each other and separated from each other; a first nanowire extended in the first direction and spaced apart from the fin-type pattern; a gate electrode surrounding the first nanowire and extending in a second direction intersecting the first direction, wherein the gate electrode is disposed on a region of the fin-type pattern and wherein the region is positioned between the first oxide region and the second oxide region; a first source/drain disposed on the first oxide region and connected with an end portion of the first nanowire; and a second source/drain disposed on the second oxide region and connected with another end portion of the first nanowire.
地址 Suwon-si, Gyeonggi-do KR