发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes a semiconductor substrate divided into a first area and a second area, the semiconductor substrate including a first dopant of a first type, a first well formed to a first depth in the first area of the semiconductor substrate, the first well including a second dopant of a second type, wherein the second type is different from the first type, a second well including a third dopant of the first type, the second well being surrounded by the first well, and a pipe gate formed on the first area of the semiconductor substrate, the pipe gate being electrically connected to the second well.
申请公布号 US2017062463(A1) 申请公布日期 2017.03.02
申请号 US201615045395 申请日期 2016.02.17
申请人 SK hynix Inc. 发明人 SHIN Wan Cheul
分类号 H01L27/115;H01L23/528;H01L23/522;H01L29/10 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor substrate divided into a first area and a second area, the semiconductor substrate including a first dopant of a first type; a first well formed to a first depth in the first area of the semiconductor substrate, the first well including a second dopant of a second type, wherein the second type is different from the first type; a second well including a third dopant of the first type, the second well being surrounded by the first well; a pipe gate formed on the first area of the semiconductor substrate, the pipe gate being electrically connected to the second well; a channel layer including a pipe channel layer, a source-side channel layer, and a drain-side channel layer, wherein the pipe channel layer is disposed in the pipe gate, wherein the source-side channel layer is coupled to the pipe channel layer, wherein the drain-side channel layer is coupled to the pipe channel layer; source-side conductive patterns surrounding the source-side channel layer, wherein the source-side conductive patterns are disposed at different levels from each other, and drain-side conductive patterns surrounding the drain-side channel layer, wherein the drain-side conductive patterns are disposed at different levels from each other.
地址 Gyeonggi-do KR