发明名称 |
DUMMY GATE PLACEMENT METHODOLOGY TO ENHANCE INTEGRATED CIRCUIT PERFORMANCE |
摘要 |
A method for increasing the performance of an integrated circuit by reducing the number of dummy gate geometries next to transistors in the speed path of an integrated circuit. |
申请公布号 |
US2017062582(A1) |
申请公布日期 |
2017.03.02 |
申请号 |
US201615351657 |
申请日期 |
2016.11.15 |
申请人 |
Texas Instruments Incorporated |
发明人 |
Choi Younsung;Ekbote Shashank;Baldwin Gregory Charles |
分类号 |
H01L29/66;G06F17/50;H01L27/02;H01L21/027;H01L21/28 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A process of forming an integrated circuit, comprising the steps:
laying out a transistor gate pattern with a transistor gate wherein the transistor gate is a critical gate in a speed path of the integrated circuit; laying out at least two dummy gate geometries adjacent to a first side of the critical gate; laying out at least two dummy gate geometries adjacent to a second side of the critical gate; placing a first dummy gate keep-out zone on the first side of the critical gate; placing a second dummy gate keep-out zone on the second side of the critical gate; and removing at least one dummy gate geometry from the first and the second dummy gate keep-out zones; saving the transistor gate pattern in a data base; forming a gate pattern photo mask using the transistor gate pattern; and printing the transistor gate pattern in photo resist on a wafer during manufacture of the integrated circuit. |
地址 |
Dallas TX US |