发明名称 DUMMY GATE PLACEMENT METHODOLOGY TO ENHANCE INTEGRATED CIRCUIT PERFORMANCE
摘要 A method for increasing the performance of an integrated circuit by reducing the number of dummy gate geometries next to transistors in the speed path of an integrated circuit.
申请公布号 US2017062582(A1) 申请公布日期 2017.03.02
申请号 US201615351657 申请日期 2016.11.15
申请人 Texas Instruments Incorporated 发明人 Choi Younsung;Ekbote Shashank;Baldwin Gregory Charles
分类号 H01L29/66;G06F17/50;H01L27/02;H01L21/027;H01L21/28 主分类号 H01L29/66
代理机构 代理人
主权项 1. A process of forming an integrated circuit, comprising the steps: laying out a transistor gate pattern with a transistor gate wherein the transistor gate is a critical gate in a speed path of the integrated circuit; laying out at least two dummy gate geometries adjacent to a first side of the critical gate; laying out at least two dummy gate geometries adjacent to a second side of the critical gate; placing a first dummy gate keep-out zone on the first side of the critical gate; placing a second dummy gate keep-out zone on the second side of the critical gate; and removing at least one dummy gate geometry from the first and the second dummy gate keep-out zones; saving the transistor gate pattern in a data base; forming a gate pattern photo mask using the transistor gate pattern; and printing the transistor gate pattern in photo resist on a wafer during manufacture of the integrated circuit.
地址 Dallas TX US