发明名称 FILL LEVEL MEASUREMENT BY MEANS OF SURFACE TOPOLOGY DETERMINATION TOGETHER WITH CENTER OF ROTATION CORRECTION
摘要 The topology of a filling material surface is first determined by sampling the surface of the filling material in order to determine the fill level. When calculating the surface topology of the filling material, the measurement signal, which has been reflected at the filling material surface and has been picked up by the antenna unit of the fill level measurement device, is evaluated, taking into account the distance between the source of the measurement signal and a center of rotation of the main emission axis of the antenna. This makes it possible to accurately determine the fill level of bulk materials, even if the source of the measurement signal and the center of rotation of the main emission axis do not coincide.
申请公布号 US2017059387(A1) 申请公布日期 2017.03.02
申请号 US201415308191 申请日期 2014.05.02
申请人 VEGA GRIESHABER KG 发明人 HOFERER Christian
分类号 G01F23/284;G01S7/41 主分类号 G01F23/284
代理机构 代理人
主权项 1: A fill level measurement device for determining a topology of a surface of a filling material or a bulk material, the fill level measurement device comprising: an antenna configured to emit a measurement signal towards the surface of the filling material or the bulk material in a direction of a main emission axis of the antenna relative to the surface, which direction can be changed by the fill level measurement device, in order to sample the surface, and configured to receive the measurement signal reflected at the filling material surface; evaluation circuitry configured to determine the topology of the surface of the filling material or the bulk material from the received measurement signal reflected at the surface and a distance between a source of the measurement signal and a center of rotation of the main emission axis.
地址 Wolfach DE