TERAHERTZ WAVEFRONT MEASUREMENT SYSTEM AND METHOD

摘要

The invention concerns a Terahertz wavefront measurement system comprising a spatial mask (4, 24) selected among a Terahertz lens array (24) or an array of apertures (4, 14). According to the invention, the Terahertz wavefront measurement system comprises an infrared camera (9), a nonlinear electro-optical crystal (5) having a first face and a second face, the first face being placed adjacent to the spatial mask (4, 24) for receiving an array of multispots in the Terahertz frequency range and the second face being placed for receiving an ultrashort pulsed infrared probe beam (20) and for generating a reflected beam (30) in the infrared frequency range having a wavefront spatial distribution depending on the array of multispots in the Terahertz frequency range, the infrared camera (9) being configured for detecting an image of the reflected beam (30) in the infrared frequency range and a processing system for analyzing the image of reflected beam (30).