发明名称 Nonvolatile memory device using two-dimensional material and method of manufacturing the same
摘要 Example embodiments relate to nonvolatile memory devices using a 2D material, and methods of manufacturing the nonvolatile memory device. The nonvolatile memory device includes a channel layer formed on a substrate, a gate stack that includes a gate electrode, source and drain electrodes. The channel layer has a threshold voltage greater than that of a graphene layer, and the gate stack includes a 2D material floating gate that is not in contact with the channel layer. The channel layer includes first and second material layers and a first barrier layer disposed between the first and second material layers, and the first and second material layers may contact the first barrier layer.
申请公布号 US9583639(B2) 申请公布日期 2017.02.28
申请号 US201615015307 申请日期 2016.02.04
申请人 Samsung Electronics Co., Ltd. 发明人 Lee Jaeho;Heo Jinseong;Park Seongjun
分类号 H01L29/788;H01L21/336;H01L29/786;H01L29/16 主分类号 H01L29/788
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. A nonvolatile memory device comprising: a substrate; a channel layer on the substrate; a gate stack on the channel layer, the gate stack including a gate electrode; a source electrode on the channel layer; and a drain electrode on the channel layer, wherein the channel layer has a threshold voltage that is greater than a threshold voltage of a graphene layer, and the gate stack includes a 2D material floating gate, and the 2D material floating gate does not contact the channel layer.
地址 Gyeonggi-do KR