发明名称 |
Interferometric non-contact optical probe and measurement |
摘要 |
A non-contact optical probe utilizes an optical reference surface that projects a curved test wavefront toward the test surface and detects it by creating curved interferometric fringes localized in space in front of the reference surface. When a point to be measured on the test surface intersects the location of the fringes, the condition is detected by the probe. Because the fringes are localized at a known position in space with respect to a reference system, the precise coordinate of the surface point can be established. Such localized fringes are preferably produced by a spectrally controllable light source. The curvature of the fringes ensures a sufficiently large angle of acceptance for the probe to capture light reflected from points of high surface slope. The probe is particularly suitable for coordinate measurement machines. |
申请公布号 |
US9581437(B2) |
申请公布日期 |
2017.02.28 |
申请号 |
US201514956355 |
申请日期 |
2015.12.01 |
申请人 |
APRE INSTRUMENTS, LLC |
发明人 |
Smythe Robert;Olszak Artur;Szwaykowski Piotr |
分类号 |
G01B9/02;G01B11/24;G01B11/00 |
主分类号 |
G01B9/02 |
代理机构 |
|
代理人 |
Durando Antonio R. |
主权项 |
1. An interferometric measurement method comprising the steps of:
providing a light source and an interferometric probe configured to project a test wavefront adapted to produce curved localized fringes when a test surface is placed at a predetermined position in space relative to a reference surface; determining a position of a single point of interest on a test surface relative to a reference coordinate system by fringe analysis when the point intersects said curved localized fringes; and repeating said determining step for a plurality of single points along a predetermined scanning pattern. |
地址 |
Tucson AZ US |