Methods for imaging a substrate include: inducing an electrospray from a nanopipette probe; varying a distance between the nanopipette probe and a surface of the substrate until a predefined electrospray current and/or a predefined distance threshold is reached; and determining a topography of the surface of the substrate based on feedback derived from distance dependency of the electrospray current. Apparatuses for performing scanning electrospray microscopy and methods for spatially controlled deposition of material on surfaces of substrates are described.
申请公布号
WO2017030975(A1)
申请公布日期
2017.02.23
申请号
WO2016US46817
申请日期
2016.08.12
申请人
INDIANA UNIVERSITY RESEARCH AND TECHNOLOGY CORPORATION
发明人
BAKER, Lane;YUILL, Elizabeth;YARGER, Tyler;FRIEDMAN, Alicia;POEHLMAN, John