TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT

摘要

A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.

主权项

1. A probe for making electrical contact with a test point in a device-under-test, the probe comprising:
a body; a rigid member structured to be able to travel linearly with respect to the body; a flexible arm having a test point contact disposed at a first end, and fastened at a second end to the rigid member; and a flexible linkage fixed to the body and connected to a point on the flexible arm between the first end and the second end, the flexible linkage structured to cause the flexible arm to bend in response to travel of the rigid member in a first direction, and to unbend in response to travel of the rigid member in a second direction.