发明名称 Method for analyzing the RF performance of a probe card, detector assembly and system for analyzing the RF performance of a probe card
摘要 A system for analyzing a probe card comprises a signal generator adapted to generate a radio frequency test signal. a connector for inputting into the probe card the radio frequency test signal, and a detector assembly. The detector assembly comprises an RF chuck for receiving a radio frequency signal from the probe card, and a sensor configured to receive the radio frequency signal from the RF chuck. The sensor is configured to measure a magnitude of the radio frequency signal and to output a measurement signal that represents only the magnitude of the radio frequency signal. The RF chuck and the sensor are mechanically coupled.
申请公布号 US9577770(B2) 申请公布日期 2017.02.21
申请号 US201514707441 申请日期 2015.05.08
申请人 APS Soutions GmbH;BE Precision Technology 发明人 Oneil Paul;Ochsenkuehn Hanns-Georg;Beijert Oscar
分类号 H04B17/00;H04B17/19;H04B17/16;H04B17/12 主分类号 H04B17/00
代理机构 Eschweiler & Potashnik, LLC 代理人 Eschweiler & Potashnik, LLC
主权项 1. A method, performed by a system, of analyzing a probe card, comprising: inputting into the probe card a radio frequency test signal; receiving from the probe card a transmitted signal in response to the inputted radio frequency test signal, the transmitted signal comprising a magnitude and a phase; measuring the magnitude of the transmitted signal, and outputting a measurement signal that represents only the magnitude of the transmitted signal.
地址 Puchheim DE