发明名称 |
Method for analyzing the RF performance of a probe card, detector assembly and system for analyzing the RF performance of a probe card |
摘要 |
A system for analyzing a probe card comprises a signal generator adapted to generate a radio frequency test signal. a connector for inputting into the probe card the radio frequency test signal, and a detector assembly. The detector assembly comprises an RF chuck for receiving a radio frequency signal from the probe card, and a sensor configured to receive the radio frequency signal from the RF chuck. The sensor is configured to measure a magnitude of the radio frequency signal and to output a measurement signal that represents only the magnitude of the radio frequency signal. The RF chuck and the sensor are mechanically coupled. |
申请公布号 |
US9577770(B2) |
申请公布日期 |
2017.02.21 |
申请号 |
US201514707441 |
申请日期 |
2015.05.08 |
申请人 |
APS Soutions GmbH;BE Precision Technology |
发明人 |
Oneil Paul;Ochsenkuehn Hanns-Georg;Beijert Oscar |
分类号 |
H04B17/00;H04B17/19;H04B17/16;H04B17/12 |
主分类号 |
H04B17/00 |
代理机构 |
Eschweiler & Potashnik, LLC |
代理人 |
Eschweiler & Potashnik, LLC |
主权项 |
1. A method, performed by a system, of analyzing a probe card, comprising:
inputting into the probe card a radio frequency test signal; receiving from the probe card a transmitted signal in response to the inputted radio frequency test signal, the transmitted signal comprising a magnitude and a phase; measuring the magnitude of the transmitted signal, and outputting a measurement signal that represents only the magnitude of the transmitted signal. |
地址 |
Puchheim DE |