发明名称 |
Method of treating a porous dielectric layer and a method of fabricating a semiconductor device using the same |
摘要 |
A method of treating a porous dielectric layer includes preparing a substrate on which the porous dielectric layer including an opening and pores exposed by the opening is formed, supplying a first precursor onto the substrate to form a first sub-sealing layer sealing the exposed pores, and supplying a second precursor onto the first sub-sealing layer to form a second sub-sealing layer covering the first sub-sealing layer. Each of the first and second precursors includes silicon, and a molecular weight of the second precursor is smaller than that of the first precursor. |
申请公布号 |
US9576848(B2) |
申请公布日期 |
2017.02.21 |
申请号 |
US201514847130 |
申请日期 |
2015.09.08 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Yim Taejin;Oszinda Thomas;Kim Byunghee;Ahn Sanghoon;Lee Naein;Jun Keeyoung |
分类号 |
H01L21/76;H01L21/768;H01L21/02 |
主分类号 |
H01L21/76 |
代理机构 |
Myers Bigel, P.A. |
代理人 |
Myers Bigel, P.A. |
主权项 |
1. A method of treating a porous dielectric layer, the method comprising:
providing a substrate including the porous dielectric layer having an opening, the porous dielectric layer including a plurality of pores exposed by the opening; supplying a first precursor onto the substrate to form a first sub-sealing layer sealing the exposed plurality of pores; and supplying a second precursor onto the first sub-sealing layer to form a second sub-sealing layer covering the first sub-sealing layer, wherein the first precursor includes a cyclosilazane-based material or a cyclosiloxane-based material and the second precursor includes a silane-based material, and wherein the second precursor has a molecular weight that is smaller than the molecular weight of the first precursor. |
地址 |
KR |