发明名称 Method of treating a porous dielectric layer and a method of fabricating a semiconductor device using the same
摘要 A method of treating a porous dielectric layer includes preparing a substrate on which the porous dielectric layer including an opening and pores exposed by the opening is formed, supplying a first precursor onto the substrate to form a first sub-sealing layer sealing the exposed pores, and supplying a second precursor onto the first sub-sealing layer to form a second sub-sealing layer covering the first sub-sealing layer. Each of the first and second precursors includes silicon, and a molecular weight of the second precursor is smaller than that of the first precursor.
申请公布号 US9576848(B2) 申请公布日期 2017.02.21
申请号 US201514847130 申请日期 2015.09.08
申请人 Samsung Electronics Co., Ltd. 发明人 Yim Taejin;Oszinda Thomas;Kim Byunghee;Ahn Sanghoon;Lee Naein;Jun Keeyoung
分类号 H01L21/76;H01L21/768;H01L21/02 主分类号 H01L21/76
代理机构 Myers Bigel, P.A. 代理人 Myers Bigel, P.A.
主权项 1. A method of treating a porous dielectric layer, the method comprising: providing a substrate including the porous dielectric layer having an opening, the porous dielectric layer including a plurality of pores exposed by the opening; supplying a first precursor onto the substrate to form a first sub-sealing layer sealing the exposed plurality of pores; and supplying a second precursor onto the first sub-sealing layer to form a second sub-sealing layer covering the first sub-sealing layer, wherein the first precursor includes a cyclosilazane-based material or a cyclosiloxane-based material and the second precursor includes a silane-based material, and wherein the second precursor has a molecular weight that is smaller than the molecular weight of the first precursor.
地址 KR