发明名称 FIXTURE TO SUPPORT REEL-TO-REEL INSPECTION OF SEMICONDUCTOR DEVICES OR OTHER COMPONENTS
摘要 A system includes a component inspection system (200) having a radiation source (202) configured to generate radiation and a radiation detector (204) configured to detect the radiation after the radiation passes through components to be inspected. The system also includes a fixture (100) configured to receive multiple reels (502, 504) that are each configured to receive a tape (506) in or on which the components are located. The fixture includes a base (102) configured to be secured to a support, a shaft (104), one or more motors (108, 110) mounted to the shaft and configured to rotate the reels, and one or more joints (106) coupling the shaft and base. The one or more joints are configured to allow (i) rotation of the shaft about a longitudinal axis of the shaft to change an orientation of the shaft with respect to the base and (ii) rotation of the shaft to change a direction at which the shaft extends away from the base.
申请公布号 WO2017027095(A1) 申请公布日期 2017.02.16
申请号 WO2016US37052 申请日期 2016.06.10
申请人 RAYTHEON COMPANY 发明人 FASOLINO, Stephen T.;WHEELER, Jason L.;NG, Joshua
分类号 G01N23/20 主分类号 G01N23/20
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