发明名称 構造物の分析装置および構造物の分析方法
摘要 Disclosed is a structure analyzing device and a structure analyzing method which can analyze a state change of a structure, which is caused before the structure is destroyed, such as a state change of degradation of the structure or the like. A structure analyzing device (10) includes a vibration detecting unit (11) which detects a vibration of a structure, and an analysis unit (12) which analyzes an output signal of the vibration detecting unit (11). The analysis unit (12) analyzes a state change of the structure by comparing a value of resonant sharpness Q, which is measured by use of the following formula (1) in a state existing when carrying out analysis, with a value of resonant sharpness Q which is measured by use of the following formula (1) in a standard state.
申请公布号 JP6079776(B2) 申请公布日期 2017.02.15
申请号 JP20140519849 申请日期 2013.01.11
申请人 日本電気株式会社 发明人 佐々木 康弘;高橋 尚武;篠田 茂樹
分类号 G01H17/00 主分类号 G01H17/00
代理机构 代理人
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