发明名称 レジスト下層膜形成用組成物及びパターン形成方法
摘要 A composition for forming a resist underlayer film includes a polysiloxane, and an organic solvent composition. The organic solvent composition includes an alkylene glycol monoalkyl ether acetate having a standard boiling point of less than 150.0° C., and an organic solvent having a standard boiling point of no less than 150.0° C. In the organic solvent composition, a content of the alkylene glycol monoalkyl ether acetate is no less than 50% by mass and no greater than 99% by mass, and a content of the organic solvent is no less than 1% by mass and no greater than 50% by mass.
申请公布号 JP6079263(B2) 申请公布日期 2017.02.15
申请号 JP20130010011 申请日期 2013.01.23
申请人 JSR株式会社 发明人 瀬古 智昭;豊川 郁宏;松村 裕史;木村 徹
分类号 G03F7/11;C08G77/18;C08K5/101;C08L83/06;G03F7/26;H01L21/027 主分类号 G03F7/11
代理机构 代理人
主权项
地址