发明名称 フォトレジスト組成物、レジストパターン形成方法及び酸発生剤
摘要 PROBLEM TO BE SOLVED: To provide a photoresist composition capable of suppressing development defects.SOLUTION: A photoresist composition comprises: [A] a polymer having a structural unit (I) including an acid-dissociable group; and [B] an acid generating agent including a compound expressed by a formula (1) below. In the formula (1), Ris a monovalent alicyclic hydrocarbon group having 3-20 carbon atoms. An aliphatic heterocycle may be condensed with a carbon ring of the alicyclic hydrocarbon group. X is **-(X-R')-X-. Xis *-COO- or -O-. Xis -COO- or -O-. R' is a divalent alicyclic hydrocarbon group having 3-20 carbon atoms. An aliphatic heterocycle may be condensed with a carbon ring of the alicyclic hydrocarbon group. n is 0 or 1. Ris a divalent straight chain hydrocarbon group having even number of carbon atoms or a divalent straight chain fluorination hydrocarbon group having even number of carbon atoms. Ris a hydrogen atom or a fluorine atom.
申请公布号 JP6079217(B2) 申请公布日期 2017.02.15
申请号 JP20120281859 申请日期 2012.12.25
申请人 JSR株式会社 发明人 吉田 昌史;笠原 一樹;中原 一雄;堀 雅史
分类号 G03F7/004;C08F20/28;G03F7/039 主分类号 G03F7/004
代理机构 代理人
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