发明名称 半導体装置の作製方法
摘要 An object is to manufacture a semiconductor device including an oxide semiconductor at low cost with high productivity in such a manner that a photolithography process is simplified by reducing the number of light-exposure masks. In a method for manufacturing a semiconductor device including a channel-etched inverted-staggered thin film transistor, an oxide semiconductor film and a conductive film are etched using a mask layer formed with the use of a multi-tone mask which is a light-exposure mask through which light is transmitted so as to have a plurality of intensities. In etching steps, a first etching step is performed by wet etching in which an etchant is used, and a second etching step is performed by dry etching in which an etching gas is used.
申请公布号 JP6082762(B2) 申请公布日期 2017.02.15
申请号 JP20150003022 申请日期 2015.01.09
申请人 株式会社半導体エネルギー研究所 发明人 須澤 英臣;笹川 慎也;村岡 大河;伊藤 俊一;細羽 みゆき
分类号 H01L21/336;G02F1/1368;H01L21/28;H01L21/3065;H01L29/786;H01L51/50;H05B33/08;H05B33/10;H05B33/14 主分类号 H01L21/336
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