System and method for automated RFID quality control

摘要

A system and method is described for an automated RFID quality control process. The method may include configuring an RFID manufacturing press with quality control specifications, manufacturing a batch of RFID inlays, executing a performance test on each RFID inlay, comparing the results of the performance test to the quality control specifications, and determining a pass or fail status for the batch of RFID inlays based on the results of the performance test. The system may include an RFID manufacturing press having at least one lane, at least one interrogator antenna, and programmable control logic for the RFID manufacturing press, wherein the programmable control logic is adapted to execute a performance test on each RFID relay of a batch of RFID relays output by the manufacturing press, compare the results of the performance test to user-configurable quality control specifications, and determine whether the batch of RFID relays meets the specifications.

主权项

1. A method for automated RFID quality control for an RFID manufacturing press having one or more lanes, comprising:
configuring the RFID manufacturing press with quality control specifications for at least one batch of RFID inlays before a series of RFID inlays are manufactured, such quality control specifications including at least one fail condition and at least of: a number of RFID inlays to be inspected in each batch, and a number of manufacturing lanes to be inspected; configuring an interface and the interface displays at least a lane identifier, lane status, number of defective tags per lane, total yield per lane, and number of splices per lane; and wherein the fail conditions include: a maximum number of defective inlays that may appear in a consecutive sequence of inlays, and a yield requirement and the quality control specifications test RFID components including chips and antennas; manufacturing the series of RFID inlays; selecting a batch of RFID inlays from the series of RFID for evaluation of the quality control specifications; executing a performance test on each RFID inlay of the selected batch of RFID inlays; comparing the results of the performance test to the quality control specifications; determining a pass or fail status for the selected batch of RFID inlays based on the results of the performance test such that the method includes a pass status indicator and a fail status indicator for each manufacturing lane; sending the selected batch of RFID inlays having at least one of the RFID inlays of the batch of RFID inlays having the fail status to an auto editing process that is separate from the RFID manufacturing press; removing the at least one of the RFID inlay with the fail status from the batch; and packaging the batch of RFID inlays.