Method and system for image analysis

摘要

A computer-implemented system and method for analyzing a sample comprising a material of interest and at least first and second adjacent materials each generally adjacent to the material of interest, the material of interest having a generally different density from the at least first and second adjacent materials. The method comprises automatically defining a plurality of regions of interest within an image of the sample that includes a junction between the material of interest and the first adjacent material and a junction between the material of interest and the second adjacent material, each of the regions of interest having a width of one or more pixels or voxels; determining respective profiles of density, intensity or attenuation within the regions of interest, each of the respective profiles crossing the respective junctions; automatically identifying the material of interest in the density profile; analyzing the profiles by automatically defining, for each of the profiles, a series of sections of the respective profile, each of the sections comprising at least first and second S-like portions of the respective profile, the first portion containing the junction between the material of interest and the first adjacent material, the second portion containing the junction between the material of interest and the second adjacent material; and locating the junction in each of the first portions, including: identifying the greatest difference in values of the respective profile between an adjacent peak and trough in a segment of the respective profile that includes at least some of the material of interest and at least some of the first adjacent material; and locating a point of inflexion in the segment.

主权项

1. A computer-implemented method for analysing a sample comprising a material of interest and at least first and second adjacent materials each generally adjacent to the material of interest, the material of interest having a generally different density from the at least first and second adjacent materials, the method comprising:
automatically defining a plurality of regions of interest within an image of the sample that includes a junction between the material of interest and the first adjacent material and a junction between the material of interest and the second adjacent material, each of said regions of interest having a width of one or more pixels or voxels; determining respective profiles of density, intensity or attenuation within the regions of interest, each of the respective profiles crossing the respective junctions; automatically identifying the material of interest in the density profile; analysing said profiles by automatically defining, for each of said profiles, a series of sections of said respective profile, each of said sections comprising at least first and second S-like portions of the respective profile, the first portion containing the junction between the material of interest and the first adjacent material, the second portion containing the junction between the material of interest and the second adjacent material; and locating the junction in each of the first portions, including:
(a) identifying the greatest difference in values of the respective profile between an adjacent peak and trough in a segment of the respective profile that includes at least some of the material of interest and at least some of the first adjacent material; and(b) locating a point of inflexion in said segment.