| 发明名称 |
DEVICE QUALITY METRICS USING UNSATISFIED PARITY CHECKS |
| 摘要 |
An apparatus includes a memory and a controller. The memory may be configured to store data. The controller may be configured to process a plurality of read/write operations to/from the memory, receive a codeword from the memory, generate a plurality of syndromes of the codeword at a plurality of possible code rates, generate a plurality of count values by counting a number of unsatisfied parity checks in each of the plurality of syndromes, generate a plurality of normalized values by dividing the plurality of count values by a plurality of lengths of the plurality of possible code rates respectively, and determine a bit error rate value of the memory based on a lowest value among the plurality of normalized values. |
| 申请公布号 |
US2017039098(A1) |
申请公布日期 |
2017.02.09 |
| 申请号 |
US201615297574 |
申请日期 |
2016.10.19 |
| 申请人 |
Seagate Technology LLC |
发明人 |
Alhussien AbdelHakim S.;Cohen Earl T.;Haratsch Erich F. |
| 分类号 |
G06F11/07 |
主分类号 |
G06F11/07 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus comprising:
a memory configured to store data; and a controller configured to
process a plurality of read/write operations to/from the memory,receive a codeword from the memory,generate a plurality of syndromes of the codeword at a plurality of possible code rates,generate a plurality of count values by counting a number of unsatisfied parity checks in each of the plurality of syndromes,generate a plurality of normalized values by dividing the plurality of count values by a plurality of lengths of the plurality of possible code rates respectively, anddetermine a bit error rate value of the memory based on a lowest value among the plurality of normalized values. |
| 地址 |
Cupertino CA US |
