发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 A lithographic apparatus comprising a reflector (15) to redirect a radiation beam e.g. an EUV beam. The position of the reflector is controlled using a controller and a positioning system. The positioning system comprises a non-compensating actuator device (300) and a compensating actuator device (200) to compensate for parasitic forces of the non-compensating actuator device. The positioning system and controller can provide a more accurate position of the reflector, reduce deformation of the reflector and reduce the magnitude of forces transmitting through the reflector.
申请公布号 US2017038693(A1) 申请公布日期 2017.02.09
申请号 US201515303478 申请日期 2015.03.19
申请人 ASML Netherlands B.V. 发明人 DE JONGH Robertus Johannes Marinus;MERKX Leon Leonardus Franciscus;MERRY Roel Johannes Elisabeth
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. A positioning system for positioning an object, wherein the positioning system is configured to position the object in N degrees of freedom, wherein N is a positive integer, the positioning system comprising: M actuator devices, each actuator device configured to apply a force to the object, and M being a positive integer greater than N, wherein at least one of the actuator devices is a compensating actuator device and at least one other of the actuator devices is a non-compensating actuator device; and a controller configured to control a compensating actuator device and a non-compensating actuator device wherein the controller is configured to control the compensating actuator device to compensate for parasitic forces of the non-compensating actuator device, wherein the compensating actuator device and the non-compensating actuator device are configured to apply a force to the object at the same point thereon.
地址 Veldhoven NL