| 摘要 |
One embodiment of the present invention provides a test socket comprising: a plurality of conductive elastic parts arranged at a position corresponding to a terminal of a device to be inspected, and in which a plurality of conductive particles are aligned in a vertical direction within an insulating elastic material; an elastic support part for supporting the conductive elastic parts while covering the conductive elastic parts; an insulating support part having a first insertion hole in which the lower part of the conductive elastic part is inserted and supported, and a second insertion hole which is positioned under the first insertion hole and into which a pad of an inspection device is inserted; a plurality of guide parts coupled to the upper surface of the insulating support part, and guiding the movement of the terminal of the device to be inspected; and a conductive pad supported by and fixed to the guide parts such that a conduction part is disposed on the upper surface of the conductive elastic part, and formed to be attachable to and detachable from the guide parts. |
