发明名称 SAWTOOTH ELECTRIC FIELD DRIFT REGION STRUCTURE FOR POWER SEMICONDUCTOR DEVICES
摘要 This invention discloses a semiconductor power device formed in a semiconductor substrate includes rows of multiple horizontal columns of thin layers of alternate conductivity types in a drift region of the semiconductor substrate where each of the thin layers having a thickness to enable a punch through the thin layers when the semiconductor power device is turned on. In a specific embodiment the thickness of the thin layers satisfying charge balance equation q*ND*WN=q*NA*WP and a punch through condition of WP<2*WD*[ND/(NA+ND)] where ND and WN represent the doping concentration and the thickness of the N type layers 160, while NA and WP represent the doping concentration and thickness of the P type layers; WD represents the depletion width; and q represents an electron charge, which cancel out. This device allows for a near ideal rectangular electric field profile at breakdown voltage with sawtooth like ridges.
申请公布号 US2017040434(A9) 申请公布日期 2017.02.09
申请号 US201314036696 申请日期 2013.09.25
申请人 Bobde Madhur 发明人 Bobde Madhur
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor power device in a semiconductor substrate with a drift region comprising: implanting and forming multiple rows of horizontal slices of continuous thin layers of alternate P-type and N-type doped layers extending continuously and horizontally in said drift region of the semiconductor substrate by manufacturing each of the continuous thin layers having a doping and thickness to enable charge balance and punch through said alternated doped layers during a conduction mode in conducting a current in a vertical direction perpendicular to and cross over the horizontal slices of the P-doped and N-doped layers
地址 San Jose CA US