发明名称 荷電粒子ビーム描画装置及び荷電粒子ビームの照射量チェック方法
摘要 A charged particle beam writing apparatus according to one aspect of the present invention includes a calculation unit to calculate a dose density that corrects a dimensional variation caused by at least one of a proximity effect, a fogging effect, and a loading effect, and indicates a dose per unit area of a charged particle beam, where the dose density has been modulated based on a dose modulation amount input from outside, a determination unit to determine whether the dose density exceeds an acceptable value, and a writing unit to write a pattern on a target object with the charged particle beam.
申请公布号 JP6076708(B2) 申请公布日期 2017.02.08
申请号 JP20120255312 申请日期 2012.11.21
申请人 株式会社ニューフレアテクノロジー 发明人 加藤 靖雄;菅沼 瑞奈
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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