发明名称 Methods of forming a pattern and devices formed by the same
摘要 The inventive concepts provide methods of forming a pattern. In the method, a block copolymer layer may be formed on a neutral layer having an uneven structure and then phase separation is induced. The neutral layer may have an affinity for all of a hydrophilic polymer and a hydrophobic polymer, so that vertical cultivation of phases of the block copolymer may be realized on the uneven structure. Thus, a self-assembled phenomenon may be induced.
申请公布号 US9564324(B2) 申请公布日期 2017.02.07
申请号 US201414220440 申请日期 2014.03.20
申请人 Samsung Electronics Co., Ltd. 发明人 Kim Eunsung;Nam Jaewoo;Shin Chulho
分类号 H01L21/00;H01L21/027;H01L29/66;H01L27/108;H01L27/115 主分类号 H01L21/00
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. A method of forming a pattern, the method comprising: forming a neutral layer having an uneven structure over a substrate such that lower surfaces of the neutral layer have different distances to the substrate; coating a block copolymer layer on the neutral layer; phase-separating the block copolymer layer to form a plurality of first patterns spaced apart from each other and a second pattern filling a space between the first patterns; removing the first patterns or the second pattern; and performing an etching process using a not-removed pattern of the first patterns or the second pattern as an etch mask.
地址 Gyeonggi-Do KR