发明名称 |
Methods of forming a pattern and devices formed by the same |
摘要 |
The inventive concepts provide methods of forming a pattern. In the method, a block copolymer layer may be formed on a neutral layer having an uneven structure and then phase separation is induced. The neutral layer may have an affinity for all of a hydrophilic polymer and a hydrophobic polymer, so that vertical cultivation of phases of the block copolymer may be realized on the uneven structure. Thus, a self-assembled phenomenon may be induced. |
申请公布号 |
US9564324(B2) |
申请公布日期 |
2017.02.07 |
申请号 |
US201414220440 |
申请日期 |
2014.03.20 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kim Eunsung;Nam Jaewoo;Shin Chulho |
分类号 |
H01L21/00;H01L21/027;H01L29/66;H01L27/108;H01L27/115 |
主分类号 |
H01L21/00 |
代理机构 |
Harness, Dickey & Pierce, P.L.C. |
代理人 |
Harness, Dickey & Pierce, P.L.C. |
主权项 |
1. A method of forming a pattern, the method comprising:
forming a neutral layer having an uneven structure over a substrate such that lower surfaces of the neutral layer have different distances to the substrate; coating a block copolymer layer on the neutral layer; phase-separating the block copolymer layer to form a plurality of first patterns spaced apart from each other and a second pattern filling a space between the first patterns; removing the first patterns or the second pattern; and performing an etching process using a not-removed pattern of the first patterns or the second pattern as an etch mask. |
地址 |
Gyeonggi-Do KR |