发明名称 X-RAY TRANSMISSION INSPECTION APPARATUS AND INSPECTION METHOD USING THE SAME
摘要 Disclosed are an X-ray transmission inspection apparatus and an inspection method using the same that are capable of preventing over-detection and erroneous detection of foreign matter even when variations in vertical position of the sample occur. The X-ray transmission inspection apparatus includes: an X-ray source (2) irradiating a sample with X-rays; a sample moving device (3) moving the sample S continuously to a predetermined direction while X-rays X are emitted from the X-ray source; a time delay integration sensor (TDI sensor) (4) provided opposed to the X-ray source based on the sample, and detecting the X-rays transmitted through the sample; a distance sensor (5) measuring a distance between the X-ray source and the sample; and a TDI controller (6) controlling the TDI sensor by changing a charge transfer speed of the TDI sensor (4) in real time based on variations in the distance measured by the distance sensor.
申请公布号 US2017031054(A1) 申请公布日期 2017.02.02
申请号 US201615220880 申请日期 2016.07.27
申请人 HITACHI HIGH-TECH SCIENCE CORPORATION 发明人 MATOBA Yoshiki;TAKEDA Akihiro;TSUBOI Shingo;SAKAI Toshihiro
分类号 G01V5/00;G01S17/08 主分类号 G01V5/00
代理机构 代理人
主权项 1. An X-ray transmission inspection apparatus comprising: an X-ray source irradiating a sample with X-rays; a sample moving device moving the sample continuously in predetermined direction while X-rays are emitted from the X-ray source; a time delay integration sensor (TDI sensor) provided opposed to the X-ray source with respect to the sample, and detecting the X-rays transmitted through the sample; a distance sensor measuring a distance between the X-ray source and the sample; and a TDI controller controlling the TDI sensor by changing a charge transfer speed of the TDI sensor in real time based on variations in the distance measured by the distance sensor.
地址 Tokyo JP