发明名称 |
X-RAY TRANSMISSION INSPECTION APPARATUS AND INSPECTION METHOD USING THE SAME |
摘要 |
Disclosed are an X-ray transmission inspection apparatus and an inspection method using the same that are capable of preventing over-detection and erroneous detection of foreign matter even when variations in vertical position of the sample occur. The X-ray transmission inspection apparatus includes: an X-ray source (2) irradiating a sample with X-rays; a sample moving device (3) moving the sample S continuously to a predetermined direction while X-rays X are emitted from the X-ray source; a time delay integration sensor (TDI sensor) (4) provided opposed to the X-ray source based on the sample, and detecting the X-rays transmitted through the sample; a distance sensor (5) measuring a distance between the X-ray source and the sample; and a TDI controller (6) controlling the TDI sensor by changing a charge transfer speed of the TDI sensor (4) in real time based on variations in the distance measured by the distance sensor. |
申请公布号 |
US2017031054(A1) |
申请公布日期 |
2017.02.02 |
申请号 |
US201615220880 |
申请日期 |
2016.07.27 |
申请人 |
HITACHI HIGH-TECH SCIENCE CORPORATION |
发明人 |
MATOBA Yoshiki;TAKEDA Akihiro;TSUBOI Shingo;SAKAI Toshihiro |
分类号 |
G01V5/00;G01S17/08 |
主分类号 |
G01V5/00 |
代理机构 |
|
代理人 |
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主权项 |
1. An X-ray transmission inspection apparatus comprising:
an X-ray source irradiating a sample with X-rays; a sample moving device moving the sample continuously in predetermined direction while X-rays are emitted from the X-ray source; a time delay integration sensor (TDI sensor) provided opposed to the X-ray source with respect to the sample, and detecting the X-rays transmitted through the sample; a distance sensor measuring a distance between the X-ray source and the sample; and a TDI controller controlling the TDI sensor by changing a charge transfer speed of the TDI sensor in real time based on variations in the distance measured by the distance sensor. |
地址 |
Tokyo JP |