| 摘要 |
The present invention is related to an apparatus and method for hadron beam verification. The apparatus allows to verify a number of different characteristics in a brief time span. The apparatus comprises at least one main degrader element and associated therewith a multiple thickness degrader element. The latter may comprise a number of patches of beam degrading material, the patches having constant but mutually different thicknesses. Alternatively, it may be a wedge-shaped element. By aiming a pencil beam at the various thicknesses, data points can be obtained which allow to make an estimation of the beam range. In addition to this, the apparatus comprises a zone where no degrader material is present, and where a measurement of the spot size can be obtained, without moving or replacing the apparatus. |
