发明名称 データサンプリング方法とシステム、及びパラメータ識別におけるその応用方法とシステム
摘要 The present invention relates to a data sampling method: sampling a physical quantity according to a sampling frequency f s ‰¤ f sh , f sn = ¶ max / µ being the upper limit of the sampling frequency; and a data sampling method and system: sampling a physical quantity with a sampling frequency satisfying Nyquist theorem, firstly performing digital low-pass filtering on an obtained sampled sequence, and then re-sampling, the re-sampling frequency f s ‰¤ ¶ max / µ , where µ is the Z-domain error of a sampling system, and ¶ max is the maximum error of an S-domain. The present invention also relates to a parameter identification method and system which firstly adopt the above data sampling method and system to obtain sampled data, and then utilize the sampled data to perform dynamic and/or static parameter identification. The data sampling method and system and the parameter identification method and system of the present invention solve technical difficulties such as relatively large errors in sampled data, digital control instability, and parameter identification failure.
申请公布号 JP6069809(B2) 申请公布日期 2017.02.01
申请号 JP20150537134 申请日期 2013.10.23
申请人 ▲ハォ▼玉山 发明人 ▲ハォ▼玉山
分类号 H03M1/54 主分类号 H03M1/54
代理机构 代理人
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