发明名称 |
Trap rich layer with through-silicon-vias in semiconductor devices |
摘要 |
An integrated circuit chip is formed with a circuit layer, a trap rich layer and through-semiconductor-vias. The trap rich layer is formed above the circuit layer. The through-semiconductor-vias are also formed above the circuit layer. In some embodiments, the circuit layer is included in a wafer, and the trap rich layer and through-semiconductor-vias are included in another wafer. The two wafers are bonded together after formation of the trap rich layer and through-semiconductor-vias. Additionally, in some embodiments, yet another wafer may also be bonded to the wafer that includes the trap rich layer and through-semiconductor-vias. Furthermore, in some embodiments, another circuit layer may be formed in the wafer that includes the trap rich layer and through-semiconductor-vias. |
申请公布号 |
US9558951(B2) |
申请公布日期 |
2017.01.31 |
申请号 |
US201314043764 |
申请日期 |
2013.10.01 |
申请人 |
QUALCOMM Incorporated |
发明人 |
Arriagada Anton;Brindle Chris;Stuber Michael A. |
分类号 |
H01L21/46;H01L21/302;H01L21/20;H01L21/762;H01L21/768;H01L21/84;H01L23/48;H01L23/522;H01L27/12;H01L29/78 |
主分类号 |
H01L21/46 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method of forming an integrated circuit chip comprising:
providing a semiconductor wafer with an active circuit layer; forming a through-semiconductor-via in said semiconductor wafer; and forming a first trap rich layer of said semiconductor wafer; wherein said through-semiconductor-via passes through said first trap rich layer and a second trap rich layer that is separated from the first trap rich layer by a semiconductor substrate layer, further wherein a third trap rich layer isolates the through-semiconductor-via from the semiconductor substrate layer. |
地址 |
San Diego CA US |