发明名称 Trap rich layer with through-silicon-vias in semiconductor devices
摘要 An integrated circuit chip is formed with a circuit layer, a trap rich layer and through-semiconductor-vias. The trap rich layer is formed above the circuit layer. The through-semiconductor-vias are also formed above the circuit layer. In some embodiments, the circuit layer is included in a wafer, and the trap rich layer and through-semiconductor-vias are included in another wafer. The two wafers are bonded together after formation of the trap rich layer and through-semiconductor-vias. Additionally, in some embodiments, yet another wafer may also be bonded to the wafer that includes the trap rich layer and through-semiconductor-vias. Furthermore, in some embodiments, another circuit layer may be formed in the wafer that includes the trap rich layer and through-semiconductor-vias.
申请公布号 US9558951(B2) 申请公布日期 2017.01.31
申请号 US201314043764 申请日期 2013.10.01
申请人 QUALCOMM Incorporated 发明人 Arriagada Anton;Brindle Chris;Stuber Michael A.
分类号 H01L21/46;H01L21/302;H01L21/20;H01L21/762;H01L21/768;H01L21/84;H01L23/48;H01L23/522;H01L27/12;H01L29/78 主分类号 H01L21/46
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method of forming an integrated circuit chip comprising: providing a semiconductor wafer with an active circuit layer; forming a through-semiconductor-via in said semiconductor wafer; and forming a first trap rich layer of said semiconductor wafer; wherein said through-semiconductor-via passes through said first trap rich layer and a second trap rich layer that is separated from the first trap rich layer by a semiconductor substrate layer, further wherein a third trap rich layer isolates the through-semiconductor-via from the semiconductor substrate layer.
地址 San Diego CA US