发明名称 MESURE PAR INTERFEROMETRIE ATOMIQUE AVEC PLUSIEURS ESPECES D'ATOMES
摘要 The invention relates to a method for measuring an external parameter (a) by means of atomic interferometry using two sets of atoms (11, 12) that belong to different species. Two measurements are taken simultaneously at the same location, but independently from one another, in order to obtain two measurement results (P11, P12). Constant phase shifts that appear in the atomic interferences for the two atom sets are quadrature-adjusted in order to ensure that one of the two measurements provides a value for the external parameter with satisfactory accuracy.
申请公布号 FR3032807(B1) 申请公布日期 2017.01.27
申请号 FR20150051271 申请日期 2015.02.16
申请人 ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES) 发明人 ZAHZAM NASSIM;BIDEL YANNICK;BRESSON ALEXANDRE;BONNIN ALEXIS
分类号 G01V7/02;G01C19/58;G01P15/00 主分类号 G01V7/02
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