发明名称 Verfahren zur temporären Arretierung eines Mikrostruktur- und/oder Rauheitsmessgeräts, Mikrostruktur- und/oder Rauheitsmessgerät zur Durchführung des Verfahrens sowie Anordnung eines Mikrostruktur- und/oder Rauheitsmessgeräts und eines Messobjekts
摘要 The invention relates to a method for temporarily locking a measuring device part, containing a measuring sensor, of a microstructure and/or roughness measuring device in a borehole of a measurement object that is delimited by a borehole wall (1). The invention also relates to a microstructure and/or roughness measuring device for carrying out the method according to the invention. The invention also relates to an assembly of a microstructure and/or roughness measuring device according to the invention and a measurement object having a borehole delimited by a borehole wall (1).
申请公布号 DE112016000017(A5) 申请公布日期 2017.01.26
申请号 DE20161100017T 申请日期 2016.03.10
申请人 Breitmeier Messtechnik GmbH 发明人 Breitmeier, Ulrich
分类号 G01B5/28;G01B5/20 主分类号 G01B5/28
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