发明名称 |
Verfahren zur temporären Arretierung eines Mikrostruktur- und/oder Rauheitsmessgeräts, Mikrostruktur- und/oder Rauheitsmessgerät zur Durchführung des Verfahrens sowie Anordnung eines Mikrostruktur- und/oder Rauheitsmessgeräts und eines Messobjekts |
摘要 |
The invention relates to a method for temporarily locking a measuring device part, containing a measuring sensor, of a microstructure and/or roughness measuring device in a borehole of a measurement object that is delimited by a borehole wall (1). The invention also relates to a microstructure and/or roughness measuring device for carrying out the method according to the invention. The invention also relates to an assembly of a microstructure and/or roughness measuring device according to the invention and a measurement object having a borehole delimited by a borehole wall (1). |
申请公布号 |
DE112016000017(A5) |
申请公布日期 |
2017.01.26 |
申请号 |
DE20161100017T |
申请日期 |
2016.03.10 |
申请人 |
Breitmeier Messtechnik GmbH |
发明人 |
Breitmeier, Ulrich |
分类号 |
G01B5/28;G01B5/20 |
主分类号 |
G01B5/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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