| 发明名称 |
Method and Apparatus for Testing a Semiconductor Device |
| 摘要 |
The present disclosure provides methods for testing and evaluating electrical parameters of electronic circuits. An exemplary method includes providing a device-under-test electrically coupled to a testing apparatus; and determining an optimum value of a first electrical parameter and an optimum value of a second parameter by testing the device-under-test according to a set of first electrical parameter values and a set of second electrical parameter values. The optimum value of the first electrical parameter and the optimum value of the second parameter are determined based on an electrical noise response of the device-under-test. |
| 申请公布号 |
US2017023644(A1) |
申请公布日期 |
2017.01.26 |
| 申请号 |
US201615283943 |
申请日期 |
2016.10.03 |
| 申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Huang Szu-Chia;Shao Jhih Jie;Chung Tang-Hsuan;Tseng Huan Chi |
| 分类号 |
G01R31/30;G01R31/02 |
主分类号 |
G01R31/30 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method comprising:
providing a device-under-test electrically coupled to a testing apparatus; and determining an optimum value of a first electrical parameter and an optimum value of a second parameter by testing the device-under-test according to a set of first electrical parameter values and a set of second electrical parameter values, wherein the optimum value of the first electrical parameter and the optimum value of the second parameter are determined based on an electrical noise response of the device-under-test. |
| 地址 |
Hsin-Chu TW |
