发明名称 SUBSTRATE TREATMENT DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PROGRAM
摘要 Provided is a feature of a rotating-type device wherein plasma can be fed uniformly onto a substrate surface. This invention is provided with: a substrate placement platform rotatably provided in a treatment chamber, a plurality of substrates being placed on the substrate placement platform along the rotation direction; a first treatment region, a second treatment region, and a third treatment region provided in the treatment chamber; a gas feed unit for feeding a first element-containing gas to the first treatment region; a first plasma generation unit provided in the second treatment region, the first plasma generation unit having a first electrode for subjecting a second element-containing gas to plasma excitation; and a second plasma generation unit provided in the third treatment region, the second plasma generation unit having a second electrode for subjecting the second element-containing gas to plasma excitation. The first electrode and the second electrode are provided at different positions in the radial direction of the substrate placement platform.
申请公布号 WO2017014179(A1) 申请公布日期 2017.01.26
申请号 WO2016JP70979 申请日期 2016.07.15
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 TANABE, Junichi;HORII, Sadayoshi;ITATANI, Hideharu;TAKASAKI, Tadashi
分类号 H01L21/31;C23C16/455;C23C16/50 主分类号 H01L21/31
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