发明名称 |
Semiconductor device carrying a micro electro mechanical system |
摘要 |
An object of the present invention is to enhance the reliability of an MEMS sensor formed on a semiconductor integrated circuit device. To achieve this object, a semiconductor device of the present invention comprises: a semiconductor integrated circuit device; a lower passivation film (6) of silicon nitride, etc. formed on the semiconductor integrated circuit device and having high moisture resistance and high chemical resistance; an MEMS portion formed on the lower passivation film (6) and including a cavity (12); and an upper passivation film (11) formed on the top surface of the MEMS portion such that the MEMS portion is hermetically sealed by the upper and lower passivation films (6, 11). |
申请公布号 |
EP1927575(B1) |
申请公布日期 |
2017.01.25 |
申请号 |
EP20070008443 |
申请日期 |
2007.04.25 |
申请人 |
Hitachi, Ltd. |
发明人 |
Fujimori, Tsukasa;Hanaoka, Yuko;Fukuda, Hiroshi |
分类号 |
B81B7/00 |
主分类号 |
B81B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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