发明名称 Sampling circuit with reduced metastability exposure
摘要 A sampling circuit uses an input stage to sample an input signal and a secondary evaluation stage to maintain the output state of the input stage. Once the input stage transitions at a clock transition, the secondary evaluation stage uses regenerative feedback devices to hold the state to help ensure the sampling circuit only switches once during an evaluation.
申请公布号 US9552892(B1) 申请公布日期 2017.01.24
申请号 US201514927964 申请日期 2015.10.30
申请人 Advanced Micro Devices, Inc. 发明人 Kosonocky Stephen V.;Sukumar Krishnan T.
分类号 H03M1/00;G11C27/02;H03K17/687;H03K3/3562;H03K3/356 主分类号 H03M1/00
代理机构 Zagorin Cave LLP 代理人 Zagorin Cave LLP
主权项 1. A sampling circuit comprising: a first circuit to sample and hold input data responsive to a transition of a clock signal and to generate an output responsive to the data, wherein the output of the first circuit includes a set and a reset signal; the first circuit including, a first inverter having an input coupled to an inverted set signal node and the set signal;a second inverter having an input coupled to an inverted reset signal node and supplying the reset signal;third and fourth inverters cross coupled to hold a state corresponding to the input data sampled by the first circuit, the third inverter supplying the inverted set signal node and the fourth inverter supplying the inverted reset signal node; and a secondary evaluation circuit to help maintain the state of the first circuit after the transition of the clock signal; the secondary evaluation circuit further including, a first evaluation transistor having a first current carrying node coupled to the inverted set signal node and a gate coupled to the set signal node;a second evaluation transistor having a first current carrying node coupled to the inverted reset signal node and a gate coupled to the reset signal node; anda third evaluation transistor having a first current carrying node coupled to second current carrying nodes of the first and second evaluation transistors, the third evaluation transistor having a gate coupled to the clock signal and a second current carrying node coupled to ground.
地址 Sunnyvale CA US